3/29/2021 0 Comments Xrd Result Analysis
Please see our XRD application notes for more specific examples.The XRD results show that the sample contains both the Rutile (31.4) and Anatase (68.6) phases of TiO 2.
Compositional results would (ideally) show a 2:1 ratio of O:Ti, but these different phases of TiO 2 have different physical and electronic properties so knowing which phase is present can be crucial. If the material is crystalline, it possesses a three dimensional ordering or structure with repeat units of atomic arrangement (unit cells). X-rays are diffracted by the repeating lattice spacings of crystalline materials, whereas they are simply scattered by amorphous materials. X-ray diffraction occurs at specific angles (2) with respect to the lattice spacings defined by Braggs Law. Any change or difference in lattice spacing results in a corresponding shift in the diffraction lines. Consequently, the X-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. Diffraction patterns can be checked against large libraries of patterns from known materials in order to identifyquantify the phases present in a sample. While these other techniques provide compositional information, XRD provides crystalline information helping to provide a more complete characterization of the material. It should be noted that by itself XRD cannot provide unequivocal compositional information because it is possible that a sample may have an amorphous component that cannot be identified by XRD. XRD can be quite powerful when combined with other techniques used for thin film analysis, such as Rutherford Backscattering Spectroscopy, Auger and X-ray Photoelectron Spectroscopy. XRD can provide phase, orientation, and other crystalline information to complement the compositional results from RBS, Auger, or XPS. XRD tends to probe much deeper than these techniques, providing more bulk information unless grazing incidence (GI-XRD) is used to enhance the surface sensitivity of the technique. Three of our instruments are equipped with optical modules that can be easily exchanged depending on the analysis requirement. This allows us to provide high quality analysis of powders, coatings, thin films, slurries, fabricated parts, or even high-resolution analysis of epitaxial films. ![]() These tools also have area detectors allowing for complete texture analyses. While most other analytical techniques provide elemental or molecular information from a sample, XRD is unique in providing a wide variety of information on structures, crystalline phases, preferred crystal orientations (texture), and other structural parameters such as crystallite size, percent crystallinity, strain, stress, and crystal defects.
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